Advanced Materials Characterization Workshop

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source: NanoBio Node     2016年11月4日
This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications

1. [personal video]
2. Quantitative AM-FM Mode for Fast and Versatile Imaging of Nanoscale Elastic Modulus (Marta Kocun) 26:40
3. High Speed, High Resolution Nanoscale Tomography Measurements (Tom McNulty) 29:24
4. X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 1 (Richard Haasch) 29:50
5. Quantitative Elastic Measurements of High Modulus Materials with Tapping/AM-FM Mode (Ted Limpoco) 16:41
6. Diffraction and Beyond: Thin Film Analysis by X-Ray Scattering... (Scott Speakman) 22:59
7. X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 2 (Richard Haasch) 23:56
8. Introduction to Elemental Analysis by ED-XRF (Justin Masone) 21:25
9. Rutherford Backscattering Spectroscopy (Tim Spila) 20:14
10. An Introduction to Scanning Electron Microscopy and Focused Ion Beam (Matthew Bresin) 59:39
11. Nano- and Micromechanics (Kathy Walsh) 26:09
12. Secondary Ion Mass Spectrometry / Rutherford Backscattering 58:24
13. X-ray Diffraction and Reflectometry 59:43
14. Technical Requirements for Successful Tip Enhanced Raman (TERS) imaging 27:22
15.AM-FM and Loss Tangent Imaging -- Two Tools for Quantitative Nanomechanical Property Mapping 26:16
16.Advanced AFM-Raman Setup: Towards the Spatial and Spectroscopic Resolution at Single Molecule Level 18:35
17. X-ray Electron Spectroscopy / Auger Electron Spectroscopy 1:02:30
18. Recent Developments in a Novel Dynamical Testing Technique 26:22
19. Nano-impact for investigation of low cycle fatigue 22:19
20. Nanofabrication of Plasmonic Devices in the Helium Ion Microscope 23:07
21. The Schmidt-Czerny-Turner Spectrograph 18:22